2 inch AlN Templates

Specifications:

Item	AlN-T-C-C50
Dimensions	Ф 50.8 mm ± 0.1 mm
Substrate	Sapphire (Single Side Polished)m
Thickness	4 ~ 5 µm
Orientation	C-plane (0001) ± 1°
Conduction Type	Semi-Insulating
Crystalline quality	XRD FWHM of (0002) < 350 arcsec. XRD FWHM of (10-12) < 450 arcsec
Edge Exclusion zone	< 2 mm
Surface Roughness	Ra < 5 nm (10 µm x 10 µm)
Package	Packaged in a class 100 clean room environment, in cassettes of 25pcs or single wafer containers, under a nitrogen atmosphere.

* Other thickness, size can be customized